External Capacitive Level Probes

CAPTRON's External Capacitive Level Probes provide a highly flexible solution for capacitive level measurement in industrial applications. Each probe is manufactured individually according to customer requirements, ensuring optimal adaptation to the application, tank geometry and process conditions.

The standard probe rod is manufactured from virgin PTFE (Teflon) and is available with diameters of 14 mm and 21 mm. Depending on the application, customers can choose between single-rod and dual-rod versions.

Unlike conventional standard-length probes, CAPTRON manufactures each probe to the exact required length with millimeter precision. Probe lengths of up to 3000 mm are available, providing maximum flexibility for a wide range of tank sizes and installation conditions.

The compact design allows operation at medium temperatures up to 180 °C. Alternative probe materials, including PEEK, are also available upon request for specialized applications.

Key Features

  • Custom-manufactured level probes
  • Millimeter-precise probe lengths
  • Available in single-rod and dual-rod versions
  • Standard probe material: Virgin PTFE (Teflon)
  • Probe diameters:
    • 14 mm
    • 21 mm
  • Probe lengths up to 3000 mm
  • Suitable for medium temperatures up to 180 °C
  • Compact and robust design
  • Adaptable to different tank geometries
  • Alternative materials available upon request

Technical Specifications

  • Measuring principle: Capacitive level measurement
  • Standard probe material: PTFE (Teflon)
  • Optional probe material: PEEK
  • Probe diameters:
    • 14 mm
    • 21 mm
  • Versions:
    • Single-rod
    • Dual-rod
  • Maximum probe length: 3000 mm
  • Maximum medium temperature: 180 °C

Applications

  • Industrial Level Measurement
  • Process Engineering
  • Tank Monitoring
  • Chemical Industry
  • Food & Beverage Industry
  • Adhesive and Resin Processing
  • Customized Measurement Applications
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2 Products

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Péter Halászi
Péter HalásziSales Engineer
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Frequently Asked Questions about External Capacitive Level Probes